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and Nb-doped SrTiO surfaces irradiated with swift heavy ionsKitamura, Akane; Ishikawa, Norito; Kondo, Keietsu; Yamamoto, Shunya*; Yamaki, Tetsuya*
Nuclear Instruments and Methods in Physics Research B, 460, p.175 - 179, 2019/12
Times Cited Count：3 Percentile：32.18(Instruments & Instrumentation)Irradiation at grazing incidence formed chains of multiple hillocks on the surface of strontium titanate (SrTiO) and titanium oxide (TiO
). They were observed with an atomic force microscope (AFM), however, the AFM measurement gives resolution errors in a nanometer order due to the curvature of the probe tip. To prevent these errors, a field emission scanning electron microscope (FE-SEM) would be a better option for observation. In this study, we performed SEM observations for the chains of the multiple hillocks. Single crystals of SrTiO and TiO were irradiated with 200 MeV 
Xe
in the tandem accelerator at JAEA-Tokai. It was revealed that a lot of isolated hillocks were formed in a line on these surface. The diameter and the interval of those hillocks are discussed in comparison to AFM observation.
irradiated with swift heavy ionsKitamura, Akane; Ishikawa, Norito; Kondo, Keietsu; Fujimura, Yuki; Yamamoto, Shunya*; Yamaki, Tetsuya*
Transactions of the Materials Research Society of Japan, 44(3), p.85 - 88, 2019/06
Swift heavy ions can create nanosized hillocks on the surfaces of various ceramics. When these materials are irradiated with swift heavy ions at normal incidence, each ion impact results in the formation of a single hillock on the surfaces. In contrast, irradiation at grazing incidence forms chains of multiple hillocks on the surface, for example, for strontium titanate (SrTiO). So far, chains of multiple hillocks have been investigated using atomic force microscopy (AFM). It should be noted that AFM measurements involve systematic errors of several nanometers due to the finite size of the probe tip. Consequently, it is possible that the image of one hillock may merge with that of a neighboring hillock even if the two hillocks are well separated. In contrast to AFM, field-emission scanning electron microscopy (FE-SEM) is a useful technique for obtaining higher-resolution images. In this study, we observed multiple nanohillocks on the surfaces of SrTiO using FE-SEM. Crystals of SrTiO(100) and 0.05 wt% Nb-doped SrTiO(100) were irradiated with 350 MeV Xe ions, respectively, at grazing incidence, where the angle between the sample surface and the beam was less than 2
. On the SrTiO surface, a chain of periodic nanohillocks is created along the ion path. In contrast, black lines accompanied by hillocks are observed on the Nb-doped SrTiO surface.
Ishikawa, Norito; Taguchi, Tomitsugu*; Okubo, Nariaki
Nanotechnology, 28(44), p.445708_1 - 445708_11, 2017/11
Times Cited Count：22 Percentile：69.89(Nanoscience & Nanotechnology)TEM method is applied to YFe
O
(YIG) and three fluorides (CaF, SrF and BaF) for observing hillocks. For YIG which is one of the amorphizable materials, hillocks are found to have amorphous feature which is consistent with amorphous feature of ion-tracks. For the fluorides, it is found that the hillocks do not exhibit amorphous feature, and they are composed of nano-crystallites. It is found for the first time that for YIG the hillock diameter is comparable to the ion-track diameter, whereas for the fluorides it is always larger than the ion-track diameter. The results indicate that recrystallization after transient melting plays an important role for formation of hillocks and ion-tracks in fluorides.
Ishikawa, Norito; Taguchi, Tomitsugu*; Kitamura, Akane
no journal, ,
In the present study, both hillock diameter and hillock height were precisely measured for YFeO (YIG) irradiated with swift heavy ions (SHI) in high electronic stopping power (Se) of 20-35 keV/nm. Precise measurement of hillock size can be achieved by irradiating SHI at oblique incidence and successively observing the as-irradiated thin samples by transmission electron microscopy (TEM). It is found that hillock diameter is always comparable to track diameter. The result is in contrast with the previous results of atomic force microscopy (AFM) claiming that hillock diameter is much larger than track diameter. Both hillock cross section and hillock height appear to follow a linear function of Se, whereas the hillock volume increases in nonlinear manner.
